International Conference and Exhibition - NANOMETROLOGY 2018
27.06.2018 - 29.06.2018
Paris, France
TOPICS:
Methodologies for the quantitative characterization of physical and chemical parameters of nanomaterials (AFM, STM, SEM, TEM, Mass spectrometry, etc)
Extension and standardization of characterization Methodologies at the nanometer scale (engineered nanoparticles, nanobiotechnologies, nanoelectronics, thin films/nanocoatings
Presentation of innovative studies reporting new results in the characterization of nanomaterials and nanosystems
Definition and realization of standards for nanometer scale characterizations (reference materials, measurement standards, etc)
Divulgation of good laboratory practice and traceability in nanoscale metrology
Modeling and simulations at the nanoscale
Society and regulation issues
Abstracts Submission Deadline - 19.05.2018