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International Conference Beam Injection Assessment of Microstructures in Semiconductors
summer 2021
Saint Petersburg, Russia
Organizers:
Ioffe Institute, St.Petersburg, Russia.
Institute of Microelectronics Technology and High Purity Materials, Russia.
Topics:
Materials characterization methods:
- Electron beam characterization methods: CL, EBIC, TEM, SEM, EBSD, e.t.c.
- Light characterization methods: spatially resolved PL, micro PL, microRaman, OBIC, e.t.c.
- Scanning Probe Microscopy: STM, AFM and SNOM techniques.
- Ion beams and other microscopy characterization techniques: SIMS, e.t.c.
Application of these and related techniques to the study of:
- Photovoltaic materials and devices;
- Point and extended defects, impurities, interfaces;
- Heterostructures, quantum structures, devices;
- 2D crystals, nanomaterials, nanowires, nanotubes;
- Optical and electronic properties of defects, microstructures and nanostructures
and more generally, any quantitative and analytical aspect of local beam injection assessment of any solids.
BIAMS2020 is postponed :(
Dear Colleagues and Participants of BIAMS2020 Conference!
On behalf of the International Committee and the Local Organizing Committee of BIAMS2020,
we regret to inform you, that
in connection with the World Health Organization announcement of an emergency of international importance due to the outbreak of coronavirus COVID-19,
and
in order to protect the health of all participants of BIAMS2020, the organizers decided to postpone the time of BIAMS Conference to later dates (tentatively, next summer), which will be announced later.
A significant part of the foreign speakers is forced to cancel their participation in the Conference due to warning measures of administration of their organizations and universities. We believe that Conference postponing would be a wise decision, as the situation is still evolving. We will organize the Conference when the coronavirus crisis is defeated and the health of our participants is not at risk.
All abstracts submitted due date will remain valid and the authors will have the opportunity, if desired, to make changes.
Please, follow the information on our website, where it will be timely updated.
On behalf of the International Committee and Local Organizing Committee,
Respectfully, Maria Zamoryanskaya,
BIAMS2020 Chairman.