SPM-2019-RCWDFM Joint International Conference
25.08.2019 - 28.08.2019
Ekaterinburg, Russia
SPM-2019-RCWDFM Joint International Conference will combine the 3rd International Conference "Scanning Probe Microscopy" (SPM), the 4th Russia-China Workshop on Dielectric and Ferroelectric Materials (RCWDFM), and International Youth Conference “Functional Imaging of Nanomaterials”.
Topics:
SPM Topics:
1. SPM in materials science
2. PFM, MFM, KPFM, SNOM, ESM, SEM, and related techniques
3. Tip-enhanced phenomena
4. Probe lithography and nano-indentation
5. Biocompatible & organic materials
6. Multiferroic phenomena and magnetoelectric coupling
7. Interface and domain engineering
8. Ferroelectrics, piezoelectrics, and ionic conductors
9. 1D and 2D nanostructured materials
10. Theory, modeling, and data processing
RCWDFM Topics:
1. High-performance piezo-/ferroelectric materials and devices
2. Thin films, single crystals, interfaces and nanoscale materials
3. Multiferroic materials and devices
4. New mechanisms/materials/devices
5. Domains, domain walls, and domain engineering
Start of online registration: February 1, 2019
Abstract submission deadline: April 15, 2019
The abstract book the International Conference “Scanning Probe Microscopy” (SPM-2018)
The abstract book the International Conference “Scanning Probe Microscopy” (SPM-2017)