Nanomeeting

 
 

Literature

Министерство образования Республики Беларусь Nanomeeting - 2011 Микроэлектроника

References

Министерство образования Республики Беларусь Nanomeeting - internatiol conference Национальная академия наук Беларуси Государственный комитет по науке и технологиям ВАК - Высшая аттестационная комиссия

37th International Conference on Microelectronic Test Structures

24.03.2025 - 27.03.2025
San Antonio, TX, USA
 
 
This conference is co-sponsored by the IEEE Electron Devices Society.
 
Topics
 
• Design
 
Methodologies, verification
Within-die circuits for process characterization/monitoring
Design enablement – Characterization and validation of digital and analog libraries
 
• Measurement techniques
 
DC, AC and RF measurements: setup, test and analysis
Reliability test - including thermal stability, failure analysis, ESD/LUP, EM. Wafer Level (WLR), etc.
Statistical analysis, variability, throughput increase, smart test strategies, compact modeling
Use of machine learning and AI in analysis of data sets - parameter extraction etc.
Wafer probing, within-die measurements, in-line metrology
Throughput, testing strategies, yield enhancement and process control tests, TCAD
 
• Applications
 
Emerging memory technologies (single cell, arrays, and application in neural networks)
Emerging transistor technologies for digital/analog/power applications
Photonic devices - silicon integration, new displays (OLED, µ-displays)
Flexible electronics and sensors (organic and inorganic materials)
M(N)EMS, actuators, sensors, PV cells and other emerging devices
 
Abstract submission deadline is October 25, 2024
 
 
 

Made in nanoelectronics Center and New Materials, SRD BSUIR, commissioned by  Ministry of Education of the Republic of Belarus.